Photoemission Electron Microscopy (PEEM)


The DEMETER beamline is dedicated to microscopy and spectroscopy using soft X-rays and is equipped with two end stations: a photoemission electron microscope (PEEM) and a scanning transmission X-ray microscope (STXM).

Contact: Anna Mandziak
Tel: +48 12 664 4103 (office)

Technical specifications

The PEEM end station is served by beamline, which can deliver variable polarization radiation (linear horizontal and vertical, and circular) in the photon energy range 100–2000 eV using elliptically polarized undulator

Sample environment

The PEEM end station is a fully equipped “surface science laboratory”. It includes a load-lock and an entrance chamber for fast sample transfer from air into the ultrahigh vacuum (UHV) environment, a preparation chamber, the main microscopic chamber. The preparation chamber includes LEED and Auger spectrometers, several evaporation sources, an ion sputtering source, and a gas dosing system, thermal annealing process up to 2000 K. An additional evaporation source is mounted in the main chamber for real time microscopy during the deposition.

When planning your XPEEM experiment, consider that samples have to fulfil main restrictions (like be UHV compatible, flat and should not charge under illumination, must fit a sample holder that limits dimensions from 5 mm to 14 mm in diameter and 3 mm in height). Available temperature in imaging chamber is several hundred degree Celsius.

Detailed information can be found on the beamline’s main homepage

The DEMETER beamline is still under commissioning and it may influence on overall beamline performance. We can not guarantee all beam parameters which may differ from the theoretical ones during experiment.